Applying the TSEE technique to Spectrolite and Opal pellets irradiated with high doses of gamma radiation

dc.contributor.authorANTONIO, PATRICIA L.
dc.contributor.authorCALDAS, LINDA V.E.
dc.coverageInternacionalpt_BR
dc.date.accessioned2018-02-19T13:19:12Z
dc.date.available2018-02-19T13:19:12Z
dc.date.issued2017pt_BR
dc.description.abstractSpectrolite + Teflon and Opal + Teflon pellets were studied in this work in relation to their dosimetric properties, using the thermally stimulated exoelectron emission (TSEE) phenomenon. The purpose of this work was to study these materials to be used in high-dose dosimetry of Co-60 irradiators, which are employed for several industrial applications. The basic physical principle of this technique is the emission of low energy electrons from the surface of different crystalS. For this reason, it is very employed in work with specially radiation sources of low penetrating power, as alpha and beta radiation, but also with gamma sources. Both materials had already their dosimettic chatacteristics verified in previous works after exposure to high doses of a Co-60 source and measurements by means of thermoluminescence (TL) and optically stimulated luminescence (OSL) techniques. The TSEE response was investigated in terms of the following tests: TSEE emission curves, reproducibility, minimum detectable doses and dose-response curves.pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)pt_BR
dc.description.sponsorshipIDFAPESP: 14/12732-9pt_BR
dc.description.sponsorshipIDCNPq: 573659/2008-7pt_BR
dc.description.sponsorshipIDCAPES: 1999/2012pt_BR
dc.format.extent538-542pt_BR
dc.identifier.citationANTONIO, PATRICIA L.; CALDAS, LINDA V.E. Applying the TSEE technique to Spectrolite and Opal pellets irradiated with high doses of gamma radiation. <b>Radiation Measurements</b>, v. 106, n. SI, p. 538-542, 2017. DOI: <a href="https://dx.doi.org/10.1016/j.radmeas.2017.04.014">10.1016/j.radmeas.2017.04.014</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/28485.
dc.identifier.doi10.1016/j.radmeas.2017.04.014pt_BR
dc.identifier.fasciculoSIpt_BR
dc.identifier.issn1350-4487pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-7362-2455
dc.identifier.percentilfi74.24en
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/28485
dc.identifier.vol106pt_BR
dc.relation.ispartofRadiation Measurementspt_BR
dc.rightsopenAccesspt_BR
dc.subjectcobalt 60
dc.subjectcrystals
dc.subjectdosimetry
dc.subjectexoelectrons
dc.subjectgamma radiation
dc.subjectgamma sources
dc.subjectirradiation
dc.subjectopals
dc.subjectpellets
dc.subjectradiation doses
dc.subjectsilicates
dc.subjectteflon
dc.subjectthermoluminescence
dc.titleApplying the TSEE technique to Spectrolite and Opal pellets irradiated with high doses of gamma radiationpt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorLINDA V. E. CALDAS
ipen.autorPATRICIA DE LARA ANTONIO
ipen.codigoautor1495
ipen.codigoautor6585
ipen.contributor.ipenauthorLINDA V. E. CALDAS
ipen.contributor.ipenauthorPATRICIA DE LARA ANTONIO
ipen.date.recebimento18-02pt_BR
ipen.identifier.fi1.369pt_BR
ipen.identifier.ipendoc24306pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi0.001 - 1.499
ipen.range.percentilfi50.00 - 74.99
ipen.type.genreArtigo
relation.isAuthorOfPublication7f46d4f4-dfd6-4485-a767-10df5b4f4f13
relation.isAuthorOfPublication5ea4ca8b-8415-4439-81d2-6fe0d6debd42
relation.isAuthorOfPublication.latestForDiscovery5ea4ca8b-8415-4439-81d2-6fe0d6debd42
sigepi.autor.atividadeANTONIO, PATRICIA L.:6585:330:Spt_BR
sigepi.autor.atividadeCALDAS, LINDA V.E.:1495:330:Npt_BR

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