Analytical modeling of the sensitivity of cylindrical PET systems based on bulk materials and metascintillators
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2023
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IEEE NUCLEAR SCIENCE SYMPOSIUM, MEDICAL IMAGING CONFERENCE AND INTERNATIONAL SYMPOSIUM ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS
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Resumo
Positron emission tomography scanners are commonly characterized by their photon sensitivity.
Scanner design often requires Monte Carlo simulations to probe different geometries and
materials. However, the computational load of such simulations can be significant and costly.
Furthermore, the applicability of the Monte Carlo approach in optimization loops is limited as
each instance, such as source position or scanner dimensions, has to be simulated independently.
In this work, Monte Carlo results have been accurately replicated by an analytical model that uses
characteristics of the foreseen cylindrical scanner and returns the sensitivity profile following
NEMA guidelines. BGO and LYSO bulk materials and several metascintillator scenarios have been
used. The mean absolute error (MAE), mean absolute percentage error (MAPE) and standard
deviation of the error (SDE) are as low as 0.49%, 2.22% and 0.26% when no energy window is
used, respectively. With an energy window applied, the analytical model presents the lowest
values of MAE and SDE, with MAPE value being 8.19%. A normalization factor has been used to
compensate for the scattered events included in the 350-650 keV window. This work facilitates
significantly the development of cylindrical scanners, allowing direct probing of their axial
sensitivity profiles.
Como referenciar
BONIFACIO, D.A.B.; LATELLA, R.; MURATA, H.M.; GONZALEZ, A.J.; LECOQ, P.; KONSTANTINOU, G. Analytical modeling of the sensitivity of cylindrical PET systems based on bulk materials and metascintillators. In: IEEE NUCLEAR SCIENCE SYMPOSIUM, MEDICAL IMAGING CONFERENCE AND INTERNATIONAL SYMPOSIUM ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS, November 4-11, 2023, Vancouver, Canada. Proceedings... Piscataway, Nova Jersey: IEEE, 2023. DOI: 10.1109/NSSMICRTSD49126.2023.10338414. Disponível em: https://repositorio.ipen.br/handle/123456789/47920. Acesso em: 20 Mar 2026.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.