Effects of the diode laser irradiation on root surfaces

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dc.contributor.authorHAYPEK, P.pt_BR
dc.contributor.authorTHEODORO, L.H.pt_BR
dc.contributor.authorBACHMANN, L.pt_BR
dc.contributor.authorEDUARDO, C.P.pt_BR
dc.contributor.authorSAMPAIO, J.E.C.pt_BR
dc.contributor.authorZEZELL, D.M.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2022-02-16T17:34:05Z
dc.date.available2022-02-16T17:34:05Z
dc.date.issued2004pt_BR
dc.description.abstractThe purpose of this study was to evaluate the temperature rising inside the pulpar cavity during the diode laser irradiation on the root surface. Twelve single root teeth were used and their mesial and distal surfaces were irradiated (808 nm, 400 m, 30 s), in a continuous mode (CW) and in an switched mode (SW) (10 Hz). The temperature rise was evaluated deppending with the power used (0.4 W to 2.2 W). The temperature was monitorated with a termopar (T) fixed inside de pulpar cavity during the irradiation. In a second step two parameters was used in a SW (10 Hz). The safety temperature was keep using the power: Group A - 0.9 W (mesial ) and Group B - 1.08 W (distal). The results showed the termal pulpar events (T) during the irradiation, based in an specific relation with the power (P), like T= -0.4+3.7P in a CW and T= -0.2+2P in a SW. The temperature rising during the irradiation was 3.4±0.4ºC on Group A and 4.0±1.0ºC on Group B. The irradiation mode and the power are much important to temperature rise inside the pulpar cavity and the 0.9 W and 1.08 W radiation on the root surfaces were safety.pt_BR
dc.format.extent110-110pt_BR
dc.identifier.citationHAYPEK, P.; THEODORO, L.H.; BACHMANN, L.; EDUARDO, C.P.; SAMPAIO, J.E.C.; ZEZELL, D.M. Effects of the diode laser irradiation on root surfaces: thermal analysis. <b>Brazilian Dental Journal</b>, v. 15, p. 110-110, 2004. Special issue. Disponível em: http://repositorio.ipen.br/handle/123456789/32749.
dc.identifier.issn0103-6440pt_BR
dc.identifier.orcid0000-0001-7404-9606pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7404-9606
dc.identifier.percentilfiSem Percentilpt_BR
dc.identifier.percentilfiCiteScoreSem Percentil CiteScorept_BR
dc.identifier.suplementoSpecial issuept_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/32749
dc.identifier.vol15pt_BR
dc.relation.ispartofBrazilian Dental Journalpt_BR
dc.rightsopenAccesspt_BR
dc.sourceInternational Congress on Laser in Dentistry, 9th, July 21-24, 2004, São Paulo, SPpt_BR
dc.subjectsemiconductor diodes
dc.subjectlaser radiation
dc.subjectdentin
dc.subjecttemperature dependence
dc.subjectteeth
dc.titleEffects of the diode laser irradiation on root surfacespt_BR
dc.typeResumos em periódicospt_BR
dspace.entity.typePublication
ipen.autorDENISE MARIA ZEZELL
ipen.autorLUCIANO BACHMANN
ipen.codigoautor693
ipen.codigoautor2411
ipen.contributor.ipenauthorDENISE MARIA ZEZELL
ipen.contributor.ipenauthorLUCIANO BACHMANN
ipen.date.recebimento22-02
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.fiCiteScoreSem CiteScorept_BR
ipen.identifier.ipendoc09172pt_BR
ipen.subtitulothermal analysispt_BR
ipen.type.genreResumo
relation.isAuthorOfPublicationa565f8ad-3432-4891-98c0-a587f497db21
relation.isAuthorOfPublication05023822-0bca-4883-9459-741a0d6befa3
relation.isAuthorOfPublication.latestForDiscovery05023822-0bca-4883-9459-741a0d6befa3
sigepi.autor.atividadeZEZELL, D.M.:693:920:Npt_BR
sigepi.autor.atividadeBACHMANN, L.:2411:920:Npt_BR
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