Characterization of a thin photodiode as a routine dosimeter for low-dose radiation processing applications

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dc.contributor.authorGONCALVES, JOSEMARY A.C.pt_BR
dc.contributor.authorMANGIAROTTI, ALESSIOpt_BR
dc.contributor.authorBUENO, CARMEN C.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2022-08-12T14:51:36Z
dc.date.available2022-08-12T14:51:36Z
dc.date.issued2022pt_BR
dc.description.abstractThe characterization of a dosimetry system based on a commercial PIN photodiode as a routine dosimeter in a 60Co industrial facility is reported. The main parameters of the dose rate response (repeatability, reproducibility, and angular dependence) and the dose response (dependence on both dose rate and accumulated dose) are investigated. The results obtained, within a dose rate range of 3.7–52.8 Gy/h and doses up to 200 Gy, fully adhere to the standard protocols established for radiation processing dosimetry. The diode performance as a routine dosimeter is validated by the good overall agreement with radiochromic films and alanine dosimetry.pt_BR
dc.description.sponsorshipInstituto de Pesquisas Energéticas e Nucleares (IPEN)pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDIPEN: DPDE Edital 04/2017pt_BR
dc.description.sponsorshipIDCNPq: 306331/2016-0; 311915/2020-5pt_BR
dc.format.extent1-7pt_BR
dc.identifier.citationGONCALVES, JOSEMARY A.C.; MANGIAROTTI, ALESSIO; BUENO, CARMEN C. Characterization of a thin photodiode as a routine dosimeter for low-dose radiation processing applications. <b>Radiation Physics and Chemistry</b>, v. 198, p. 1-7, 2022. DOI: <a href="https://dx.doi.org/10.1016/j.radphyschem.2022.110200">10.1016/j.radphyschem.2022.110200</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/33206.
dc.identifier.doi10.1016/j.radphyschem.2022.110200pt_BR
dc.identifier.issn0969-806Xpt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.percentilfi65.8pt_BR
dc.identifier.percentilfiCiteScore74pt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/33206
dc.identifier.vol198pt_BR
dc.relation.ispartofRadiation Physics and Chemistrypt_BR
dc.rightsopenAccesspt_BR
dc.subjectphotodiodes
dc.subjectthin films
dc.subjectgamma radiation
dc.subjectdosimetry
dc.subjectsilicon diodes
dc.titleCharacterization of a thin photodiode as a routine dosimeter for low-dose radiation processing applicationspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento22-08
ipen.identifier.fi2.9pt_BR
ipen.identifier.fiCiteScore4.9pt_BR
ipen.identifier.ipendoc28862pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi50.00 - 74.99
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeBUENO, CARMEN C.:1592:240:Npt_BR
sigepi.autor.atividadeGONCALVES, JOSEMARY A.C.:924:240:Spt_BR

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