Influence of crystalline surface quality on TlBr radiation detector performance
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IEEE Transactions on Nuclear Science
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In this study, TlBr detectors were fabricated from
crystals purified by the multipass zone refining and grown by
the Bridgman method. Detectors were prepared using TlBr
0.3-mm-thick wafers, with surface submitted to different mechanical and chemical treatments. Optical microscopy and scanning
electron microscopy evaluated the TlBr wafers surface quality.
To analyze the surface quality influence in the detector response,
systematic measurements of the pulse height spectra and energy
resolution were carried out for each prepared radiation detector.
The radiation response for these detectors was performed under
241Am gamma radiation excitation at room temperature. The influence of the surface quality of the TlBr wafer on its performance
as a radiation detector was observed.
Como referenciar
OLIVEIRA, ICIMONE B.; COSTA, FABIO E.; KIYOHARA, PEDRO K.; HAMADA, MARGARIDA M. Influence of crystalline surface quality on TlBr radiation detector performance. IEEE Transactions on Nuclear Science, v. 51, n. 5, p. 2058-2062, 2005. DOI: 10.1109/TNS.2005.856788. Disponível em: http://repositorio.ipen.br/handle/123456789/5481. Acesso em: 30 Dec 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.