Incorporation of Cd-doping in SnO2

dc.contributor.authorSCHELL, J.pt_BR
dc.contributor.authorDANG, T.T.pt_BR
dc.contributor.authorCARBONARI, A.W.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2020-04-06T19:28:43Z
dc.date.available2020-04-06T19:28:43Z
dc.date.issued2020pt_BR
dc.description.abstractTuning the electrical properties of materials by controlling their doping content has been utilized for decades in semiconducting oxides. Here, an atomistic view is successfully employed to obtain local information on the charge distribution and point defects in Cd-doped SnO2. We present a study that uses the time-di erential perturbed gamma–gamma angular correlations (TDPAC) method in samples prepared by using a sol–gel approach. The hyperfine field parameters are presented as functions of the annealing temperature in pellet samples to show the evolution of incorporating Cd dopants into the crystal lattice. Additionally, the system was characterized with X-ray fluorescence, electron dispersive spectroscopy, and scanning electron microscopy after the probe nuclei 111In(111Cd) decayed. The TDPAC results reveal that the probe ions were incorporated into two di erent local environments of the SnO2 lattice at temperatures up to 973 K for cation substitutional sites.pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipIDCNPq: 290102/2011-1; 304627/2017-8pt_BR
dc.description.sponsorshipIDFAPESP: 18/18657-0pt_BR
dc.format.extent1-7pt_BR
dc.identifier.citationSCHELL, J.; DANG, T.T.; CARBONARI, A.W. Incorporation of Cd-doping in SnO2. <b>Crystals</b>, v. 10, n. 1, p. 1-7, 2020. DOI: <a href="https://dx.doi.org/10.3390/cryst10010035">10.3390/cryst10010035</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/31090.
dc.identifier.doi10.3390/cryst10010035pt_BR
dc.identifier.fasciculo1pt_BR
dc.identifier.issn2073-4352pt_BR
dc.identifier.orcid0000-0002-4499-5949pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-4499-5949
dc.identifier.percentilfi52.44pt_BR
dc.identifier.percentilfiCiteScore52.50
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/31090
dc.identifier.vol10pt_BR
dc.relation.ispartofCrystalspt_BR
dc.rightsopenAccesspt_BR
dc.subjectdoped materials
dc.subjecttin oxides
dc.subjectstannates
dc.subjectgamma cascades
dc.subjectangular correlation
dc.subjectperturbed angular correlation
dc.subjectsol-gel process
dc.subjectgamma spectrometers
dc.subjectsemiconductor materials
dc.subjectoxides
dc.titleIncorporation of Cd-doping in SnO2pt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorARTUR WILSON CARBONARI
ipen.codigoautor1437
ipen.contributor.ipenauthorARTUR WILSON CARBONARI
ipen.date.recebimento20-04
ipen.identifier.fi2.589pt_BR
ipen.identifier.fiCiteScore3.2
ipen.identifier.ipendoc26877pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi50.00 - 74.99
ipen.type.genreArtigo
relation.isAuthorOfPublication8f236231-e73c-4182-a596-d83e49cd0404
relation.isAuthorOfPublication.latestForDiscovery8f236231-e73c-4182-a596-d83e49cd0404
sigepi.autor.atividadeCARBONARI, A.W.:1437:310:Npt_BR

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