Error analysis for near-field EMC problems based on multipolar expansion approach
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IEEE Transactions on Magnetics
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Resumo
Devices using power electronics are ubiquitous today and they are unfortunately intrinsic sources of electromagnetic interference.
To address these electromagnetic compatibility problems at the initial design phase, a predictive method based on multipole expansion
in spherical harmonics of the near field around each device was developed. To determine the basic expansions of a given source,
a dedicated measurement bench has been designed. In this paper, some important issues of this approach and the measurement
bench are studied, especially the error analysis on the measurements and the inverse problems. Some experimental results are also
shown in the end.
Como referenciar
LI, Z.; TAVERNIER, F.; BREARD, A.; KRAHENBUHL, L.; VOYER, D.; SARTORI, C.A.F. Error analysis for near-field EMC problems based on multipolar expansion approach. IEEE Transactions on Magnetics, v. 53, n. 6, 2017. DOI: 10.1109/TMAG.2017.2664985. Disponível em: http://repositorio.ipen.br/handle/123456789/28466. Acesso em: 20 Mar 2026.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.