Determination of Si content in Fe-doped HfSiO4 nanoparticles by neutron activation analysis

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dc.contributor.authorSALES, T.S.N.
dc.contributor.authorBOSCH-SANTOS, B.
dc.contributor.authorSAIKI, M.
dc.contributor.authorPEREIRA, L.F.
dc.contributor.authorCARBONARI, A.W.
dc.contributor.authorSAXENA, R.N.
dc.contributor.authorBURIMOVA, A.
dc.coverageInternacionalpt_BR
dc.creator.eventoINTERNATIONAL TOPICAL MEETING ON INDUSTRIAL RADIATION AND RADIOISOTOPE MEASUREMENT APPLICATIONS, 10thpt_BR
dc.date.accessioned2017-10-25T10:09:58Z
dc.date.available2017-10-25T10:09:58Z
dc.date.eventoJuly 09-13, 2017pt_BR
dc.description.abstractNew synthesis method of Fe-doped hafnium silicate nanoparticles (NPs) with tetragonal structure is reported. The procedure implies auto-controlled incorporation of Si from the quartz to the iron-doped hafnium oxide NPs. X-ray diffraction data has shown that lattice parameters of Fe-HfSiO4 thus obtained are very close to those previously known for hafnon. It was established that the hafnon-like phase has stabilized at T=1173K which is ~500K lower than the corresponding transition of bare bulk hafnium silicate. The fractions of Si and Fe in the composite matrix were evaluated via neutron activation analysis (NAA). Delayed gamma NAA results allowed to assume that (i) Fe initially substituted Hf in the HfO2 lattice; (ii) there was no migration of iron atoms from Hf to Si sites throughout the formation of hafnon-like phase; (iii) Fe-doped hafnium oxide has taken as much Si from the quartz as was needed for the arrangement of Fe1-x-Hf x SiO4 tetragonal system. Our results are consistent with those observed for similar materials, such as metal (Fe,V) doped zircon, where metal has also demonstrated catalytic effect on phase stabilization.pt_BR
dc.event.siglaIRRMApt_BR
dc.format.extent76-77pt_BR
dc.identifier.citationSALES, T.S.N.; BOSCH-SANTOS, B.; SAIKI, M.; PEREIRA, L.F.; CARBONARI, A.W.; SAXENA, R.N.; BURIMOVA, A. Determination of Si content in Fe-doped HfSiO4 nanoparticles by neutron activation analysis. In: INTERNATIONAL TOPICAL MEETING ON INDUSTRIAL RADIATION AND RADIOISOTOPE MEASUREMENT APPLICATIONS, 10th, July 09-13, 2017, Chicago, IL, USA. <b>Abstract...</b> p. 76-77. Disponível em: http://repositorio.ipen.br/handle/123456789/27956.
dc.identifier.orcidhttps://orcid.org/0000-0002-4499-5949
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/27956
dc.local.eventoChicago, IL, USApt_BR
dc.rightsopenAccesspt_BR
dc.titleDetermination of Si content in Fe-doped HfSiO4 nanoparticles by neutron activation analysispt_BR
dc.typeResumo de eventos científicospt_BR
dspace.entity.typePublication
ipen.autorARTUR WILSON CARBONARI
ipen.autorANASTASIA BURIMOVA
ipen.autorRAJENDRA NARAIN SAXENA
ipen.autorLUCIANO FABRICIO DIAS PEREIRA
ipen.autorMITIKO SAIKI
ipen.autorBRIANNA BOSCH DOS SANTOS
ipen.autorTATIANE DA SILVA NASCIMENTO
ipen.codigoautor1437
ipen.codigoautor14454
ipen.codigoautor1329
ipen.codigoautor3346
ipen.codigoautor1178
ipen.codigoautor7480
ipen.codigoautor9322
ipen.contributor.ipenauthorARTUR WILSON CARBONARI
ipen.contributor.ipenauthorANASTASIA BURIMOVA
ipen.contributor.ipenauthorRAJENDRA NARAIN SAXENA
ipen.contributor.ipenauthorLUCIANO FABRICIO DIAS PEREIRA
ipen.contributor.ipenauthorMITIKO SAIKI
ipen.contributor.ipenauthorBRIANNA BOSCH DOS SANTOS
ipen.contributor.ipenauthorTATIANE DA SILVA NASCIMENTO
ipen.date.recebimento17-10pt_BR
ipen.event.datapadronizada2017pt_BR
ipen.identifier.ipendoc23266pt_BR
ipen.notas.internasAbstractpt_BR
ipen.type.genreResumo
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sigepi.autor.atividadeSALES, T.S.N.:9322:-1:Spt_BR
sigepi.autor.atividadeBOSCH-SANTOS, B.:7480:310:Npt_BR
sigepi.autor.atividadeSAIKI, M.:1178:320:Npt_BR
sigepi.autor.atividadePEREIRA, L.F.:3346:310:Npt_BR
sigepi.autor.atividadeCARBONARI, A.W.:1437:310:Npt_BR
sigepi.autor.atividadeSAXENA, R.N.:1329:310:Npt_BR
sigepi.autor.atividadeBURIMOVA, A.:14454:310:Npt_BR
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