X-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetry

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dc.contributor.authorICHIKAWA, R.U.pt_BR
dc.contributor.authorLINHARES, H.M.S.M.D.pt_BR
dc.contributor.authorSILVA, A.S.B. dapt_BR
dc.contributor.authorTEIXEIRA, M.I.pt_BR
dc.contributor.authorRANIERI, I.M.pt_BR
dc.contributor.authorTURRILLAS, X.pt_BR
dc.contributor.authorMARTINEZ, L.G.pt_BR
dc.coverageNacionalpt_BR
dc.date.accessioned2019-08-09T11:51:36Z
dc.date.available2019-08-09T11:51:36Z
dc.date.issued2019pt_BR
dc.description.abstractIn this work, the structure and microstructure of Nd:KY3F10 nanoparticles was probed using X-ray synchrotron diffraction analysis. Rietveld refinement was applied to obtain cell parameters, atomic positions and atomic dis-placement factors to be compared with the ones found in literature. X-ray line profile methods were applied to determine mean crystallite size and crystallite size distribution. Thermoluminescent (TL) emission curves were measured for different radiation doses, from 0.10 kGy up to 10.0 kGy. Dose-response curves were obtained by area integration beneath the peaks from TL. The reproducibility of the results in this work has shown that this material can be considered a good dosimetric material.pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDCNPq: 206983/2014-0pt_BR
dc.format.extent1-13pt_BR
dc.identifier.citationICHIKAWA, R.U.; LINHARES, H.M.S.M.D.; SILVA, A.S.B. da; TEIXEIRA, M.I.; RANIERI, I.M.; TURRILLAS, X.; MARTINEZ, L.G. X-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetry. <b>Brazilian Journal of Radiation Sciences</b>, v. 7, n. 2A, p. 1-13, 2019. DOI: <a href="https://dx.doi.org/10.15392/bjrs.v7i2A.586">10.15392/bjrs.v7i2A.586</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/30055.
dc.identifier.doi10.15392/bjrs.v7i2A.586pt_BR
dc.identifier.fasciculo2Apt_BR
dc.identifier.issn2319-0612pt_BR
dc.identifier.orcid0000-0001-7707-7821pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7707-7821
dc.identifier.percentilfiSem Percentilpt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30055
dc.identifier.vol7pt_BR
dc.relation.ispartofBrazilian Journal of Radiation Sciencespt_BR
dc.rightsopenAccesspt_BR
dc.sourceThe Meeting on Nuclear Applications (ENAN), 13th, 22-27 de outubro, 2017, Belo Horizonte, MGpt_BR
dc.subjectnanoparticles
dc.subjectx-ray diffraction
dc.subjectradiation doses
dc.subjectdoped materials
dc.subjectthermoluminescence
dc.subjectneodymium
dc.subjectyttrium fluorides
dc.subjectcritical size
dc.subjectdose-response relationships
dc.subjectdosimetry
dc.titleX-ray diffraction analysis of KY3F10 nanoparticles doped with Nd and preliminary studies for its use in high-dose radiation dosimetrypt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorANDRE SANTOS BARROS DA SILVA
ipen.autorLUIS GALLEGO MARTINEZ
ipen.autorIZILDA MARCIA RANIERI
ipen.autorMARIA INES TEIXEIRA
ipen.autorRODRIGO UCHIDA ICHIKAWA
ipen.codigoautor12657
ipen.codigoautor397
ipen.codigoautor1445
ipen.codigoautor2431
ipen.codigoautor10118
ipen.contributor.ipenauthorANDRE SANTOS BARROS DA SILVA
ipen.contributor.ipenauthorLUIS GALLEGO MARTINEZ
ipen.contributor.ipenauthorIZILDA MARCIA RANIERI
ipen.contributor.ipenauthorMARIA INES TEIXEIRA
ipen.contributor.ipenauthorRODRIGO UCHIDA ICHIKAWA
ipen.date.recebimento19-08
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc25848pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationbe417826-6640-4e6d-ad54-5f478f184290
relation.isAuthorOfPublicationd024d136-878b-4d31-bb7e-c1cb06324cfb
relation.isAuthorOfPublication3cc14224-e510-456f-afb1-82002c20ac7a
relation.isAuthorOfPublication77e3728e-ac22-44ec-b407-8f95984cf27d
relation.isAuthorOfPublication0f8315c9-e186-43ee-ba65-2c03092b4d04
relation.isAuthorOfPublication.latestForDiscovery0f8315c9-e186-43ee-ba65-2c03092b4d04
sigepi.autor.atividadeMARTINEZ, L.G.:397:730:Npt_BR
sigepi.autor.atividadeRANIERI, I.M.:1445:-1:Npt_BR
sigepi.autor.atividadeTEIXEIRA, M.I.:2431:330:Npt_BR
sigepi.autor.atividadeSILVA, A.S.B. da:12657:730:Npt_BR
sigepi.autor.atividadeICHIKAWA, R.U.:10118:730:Spt_BR
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