Random laser materials

dc.contributor.authorWETTER, N.pt_BR
dc.contributor.authorJIMENEZ-VILLAR, E.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2019-10-02T17:14:47Z
dc.date.available2019-10-02T17:14:47Z
dc.date.issued2019pt_BR
dc.description.abstractRandom lasers hold the premise for cheap coherent light sources that can be miniaturized and molded into any shape and used for speckle-free imaging in biology, remote sensing, display technology, encrypting, cancer detection and distributed amplification. However, they require improvements specifically in terms of efficiency and low emission threshold. This work details for the first time a strategy for increasing the efficiency of a random laser that consists in using smaller particles, trapped between large particles to serve as absorption and gain centers whereas the large particles control mainly the light diffusion into the sample. A record slope efficiency of more than 50% was achieved using yttrium vanadate particles with mean particle size of 54 μm by optimizing the distribution of the polydispersed particles. In addition, random lasing with very low emission threshold (0.24 mJ/cm2) is also reported in a strongly disordered optical medium that is in the transition regime to Anderson localization composed by a colloidal suspension of core–shell TiO2@ Silica nanoparticles in ethanol solution of rhodamine 6G. A promising method called fraction of absorbed pump power allowed us to infer the emission threshold for localized modes (peaks mode). The classical super-fluorescence band (ASE) of the random laser was measured separately by collecting the emission at the back of the samples, showing a linear dependence with pumping fluence without gain depletion. The intensity of peaks during Anderson transition is approximately equal within a broad frequency range, indicating suppression of the interaction between the peak modes. The random lasers have been characterized by measurements of backscattering cone, absorption and reflection measurement, transport mean free path, average photon path length and fill fractions.pt_BR
dc.format.extent16761-16773pt_BR
dc.identifier.citationWETTER, N.; JIMENEZ-VILLAR, E. Random laser materials: from ultrahigh efficiency to very low threshold (Anderson localization). <b>Journal of Materials Science: Materials in Electronics</b>, v. 30, n. 18, p. 16761-16773, 2019. DOI: <a href="https://dx.doi.org/10.1007/s10854-019-01289-x">10.1007/s10854-019-01289-x</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/30157.
dc.identifier.doi10.1007/s10854-019-01289-xpt_BR
dc.identifier.fasciculo18pt_BR
dc.identifier.issn0957-4522pt_BR
dc.identifier.orcid0000-0002-9379-9530pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-9379-9530
dc.identifier.percentilfi48.512pt_BR
dc.identifier.percentilfiCiteScore67.50
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30157
dc.identifier.vol30pt_BR
dc.relation.ispartofJournal of Materials Science: Materials in Electronicspt_BR
dc.rightsopenAccesspt_BR
dc.subjectlasers
dc.subjectrandomness
dc.subjectmaterials
dc.subjectemission spectra
dc.subjectparticles
dc.subjectnanoparticles
dc.subjectgrain size
dc.subjectparticle size classifiers
dc.titleRandom laser materialspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorERNESTO JIMENEZ VILLAR
ipen.autorNIKLAUS URSUS WETTER
ipen.codigoautor14647
ipen.codigoautor919
ipen.contributor.ipenauthorERNESTO JIMENEZ VILLAR
ipen.contributor.ipenauthorNIKLAUS URSUS WETTER
ipen.date.recebimento19-10
ipen.identifier.fi2.220pt_BR
ipen.identifier.fiCiteScore3.9
ipen.identifier.ipendoc25818pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.identifier.ods3
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi25.00 - 49.99
ipen.subtitulofrom ultrahigh efficiency to very low threshold (Anderson localization)pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication2add7063-89f6-4497-8137-6fc6b4bbc93c
relation.isAuthorOfPublication464db0c6-6072-480b-b899-81848893f7eb
relation.isAuthorOfPublication.latestForDiscovery464db0c6-6072-480b-b899-81848893f7eb
sigepi.autor.atividadeJIMENEZ-VILLAR, E.:14647:910:Npt_BR
sigepi.autor.atividadeWETTER, N.:919:910:Spt_BR
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