Diagnostic x-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodes

dc.contributor.authorGONCALVES, J.A.C.pt_BR
dc.contributor.authorBARROS, V.S.M.pt_BR
dc.contributor.authorASFORA, V.K.pt_BR
dc.contributor.authorKHOURY, H.J.pt_BR
dc.contributor.authorBUENO, C.C.pt_BR
dc.coverageNacionalpt_BR
dc.date.accessioned2019-07-29T19:10:50Z
dc.date.available2019-07-29T19:10:50Z
dc.date.issued2019pt_BR
dc.description.abstractThe results obtained with a standard float zone (FZ) silicon diode, processed at the Helsinki Institute of Physics, used as on-line diagnostic X-ray dosimeter are described in this work. The device was connected in the short-circuit current mode to the input of an integrating electrometer. The response repeatability and the current sensitivity coefficient of the diode were measured with diagnostic X-ray beams in the range of 40-80 kV. The dose-response of the device, evaluated from 10 mGy up to 500 mGy, was linear with high charge sensitivity. Nevertheless, significant energy dependence was observed in the charge sensitivity of FZ device for energies below 70 kV. The dosimetric characteristics of this FZ diode were compared to those of an XRA-50 commercial Si diode, specially designed to X-ray dosimetry. The results obtained with the FZ diode evidenced that it can be an alternative choice for diagnostic X-ray dosimetry, although it needs to be calibrated for individual X-ray beam energies. The studies of long-term stability and the radiation hardness of these diodes are under way.pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipIDCNPq: 478967/2007-1; 310493/2009-9pt_BR
dc.format.extent1-9pt_BR
dc.identifier.citationGONCALVES, J.A.C.; BARROS, V.S.M.; ASFORA, V.K.; KHOURY, H.J.; BUENO, C.C. Diagnostic x-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodes. <b>Brazilian Journal of Radiation Sciences</b>, v. 7, n. 2A, p. 1-9, 2019. DOI: <a href="https://dx.doi.org/10.15392/bjrs.v7i2A.592">10.15392/bjrs.v7i2A.592</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/29974.
dc.identifier.doi10.15392/bjrs.v7i2A.592pt_BR
dc.identifier.fasciculo2Apt_BR
dc.identifier.issn2319-0612pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.percentilfiSem Percentilpt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/29974
dc.identifier.vol7pt_BR
dc.relation.ispartofBrazilian Journal of Radiation Sciencespt_BR
dc.rightsopenAccesspt_BR
dc.sourceThe Meeting on Nuclear Applications (ENAN), 13th, 22-27 de outubro, 2017, Belo Horizonte, MGpt_BR
dc.subjectx-ray dosimetry
dc.subjectx radiation
dc.subjectdose rates
dc.subjectdosemeters
dc.subjectdiagnosis
dc.subjectenergy dependence
dc.subjectzone melting
dc.subjectsilicon diodes
dc.subjectsensitivity
dc.subjectbeams
dc.subjectcomparative evaluations
dc.titleDiagnostic x-ray dosimeters using standard float zone (FZ) and XRA-50 commercial diodespt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento19-07
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc25759pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeBUENO, C.C.:1592:240:Npt_BR
sigepi.autor.atividadeGONCALVES, J.A.C.:924:240:Spt_BR

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