Feasibility studies of using thin entrance window photodiodes for clinical electron beam dosimetry

dc.contributor.authorNASCIMENTO, C.R.pt_BR
dc.contributor.authorASFORA, V.K.pt_BR
dc.contributor.authorBARROS, V.S.M.pt_BR
dc.contributor.authorGONCALVES, J.A.C.pt_BR
dc.contributor.authorANDRADE, L.F.R.pt_BR
dc.contributor.authorKHOURY, H.J.pt_BR
dc.contributor.authorBUENO, C.C.pt_BR
dc.coverageNacionalpt_BR
dc.date.accessioned2019-07-31T12:10:38Z
dc.date.available2019-07-31T12:10:38Z
dc.date.issued2019pt_BR
dc.description.abstractThe response of the commercial XRA-24 PIN photodiode (5.76 mm2 active area) for clinical electron beam dosimetry covering the range of 8-12 MeV was investigated. Within this energy range, the charge generated in the diode’s sensitive volume is linearly dependent on the absorbed dose up to 320 cGy. However, charge sensitivity coefficients evidenced that the dose response of the diode is slightly dependent on the electron beam energy. Indeed, the diode’s energy dependence was within 8.5% for 8-12 MeV electron beams. On the other hand, it was also observed an excellent repeatability of these results with a variation coefficient (VC) lower than 0.4%, which is within the 1% tolerance limit recommended by the AAPM TG-62. Furthermore, the agreement between the percentage depth dose profiles (PDD) gathered with the diode and the ionization chamber allowed achieving the electron beam quality within 1% of that obtained with the ionization chamber. Based on these results, the photodiode XRA-24 can be a reliable and inexpensive alternative for electron beams dosimetry.pt_BR
dc.format.extent1-9pt_BR
dc.identifier.citationNASCIMENTO, C.R.; ASFORA, V.K.; BARROS, V.S.M.; GONCALVES, J.A.C.; ANDRADE, L.F.R.; KHOURY, H.J.; BUENO, C.C. Feasibility studies of using thin entrance window photodiodes for clinical electron beam dosimetry. <b>Brazilian Journal of Radiation Sciences</b>, v. 7, n. 2A, p. 1-9, 2019. DOI: <a href="https://dx.doi.org/10.15392/bjrs.v7i2A.577">10.15392/bjrs.v7i2A.577</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/29985.
dc.identifier.doi10.15392/bjrs.v7i2A.577pt_BR
dc.identifier.fasciculo2Apt_BR
dc.identifier.issn2319-0612pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.percentilfiSem Percentilpt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/29985
dc.identifier.vol7pt_BR
dc.relation.ispartofBrazilian Journal of Radiation Sciencespt_BR
dc.rightsopenAccesspt_BR
dc.sourceThe Meeting on Nuclear Applications (ENAN), 13th, 22-27 de outubro, 2017, Belo Horizonte, MGpt_BR
dc.subjectdosimetry
dc.subjectelectron beams
dc.subjectfeasibility studies
dc.subjectionization chambers
dc.subjectphotodiodes
dc.subjectdepth dose distributions
dc.subjectenergy dependence
dc.subjectmev range 01-10
dc.subjectsilicon diodes
dc.titleFeasibility studies of using thin entrance window photodiodes for clinical electron beam dosimetrypt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.codigoautor1592
ipen.codigoautor924
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.date.recebimento19-07
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc25772pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication.latestForDiscovery76fdc4d1-7624-4332-a9d0-f06826000679
sigepi.autor.atividadeBUENO, C.C.:1592:240:Npt_BR
sigepi.autor.atividadeGONCALVES, J.A.C.:924:240:Npt_BR

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