Study of the response of a commercial photodiode for photons and electrons with energies between 10 and 100 keV
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2019
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IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE; INTERNATIONAL SYMPOSIUM ON ROOM-TEMPERATURE X-RAY AND GAMMA-RAY DETECTORS, 26th
Resumo
In this work, a commercial low-cost silicon PIN (p type-Intrinsic-n type) photodiode model BPX 65 is characterized
with respect to reverse current and capacitance of the junction. The measurements indicate that the photodiode is
fully depleted for a reverse bias greater than 17 V and the width of the depletion zone is estimated to be 60 (3)
μm. The device has been applied for gamma spectrometry, showing a resolution around 2.4 keV (FWHM - Full Width
at Half Maximum) for photons with energies between 14 and 136 keV. This is the same resolution obtained with a
pulser, 2.39 (2) keV, indicating that the main limitation of the spectroscopy system employed is electronic noise. As
this is a promising detector not only for low-energy photons, but also for charged particles, the response of the BPX
65 has been investigated with a low-dispersion electron beam with energies between 20 and 100 keV. Under such
conditions, the response function cannot be described as a simple Gaussian distribution. Moreover, the analytical
response functions for electrons presented in the literature need to be generalized including a polynomial term. The
proposed response function was tested and the behavior of the free parameters with the energy of the impinging
electron is shown to be smooth. Thus, it is possible to extract from the data a well behaved parametrization.
Como referenciar
PETRI, ANNA R.; MALAFRONTE, ALEXANDRE A.; GONCALVES, JOSEMARY A.C.; BARROS, SUELEN F.; BUENO, CARMEN C.; MAIDANA, NORA L.; MANGIAROTTI, ALESSIO; MARTINS, MARCOS N.; VANIN, VITO R. Study of the response of a commercial photodiode for photons and electrons with energies between 10 and 100 keV. In: IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE; INTERNATIONAL SYMPOSIUM ON ROOM-TEMPERATURE X-RAY AND GAMMA-RAY DETECTORS, 26th, October 26 - November 2, 2019, Manchester, UK. Abstract... Piscataway, NJ, USA: IEEE Nuclear and Plasma Sciences Society, 2019. p. 129-129. Disponível em: http://repositorio.ipen.br/handle/123456789/30963. Acesso em: 30 Dec 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.