Model for analysis of biaxial and triaxial stresses by X-ray diffraction assuming orthotropic materials

dc.contributor.authorSANTOS, EDSON M.pt_BR
dc.contributor.authorORLANDO, MARCOS T.D.pt_BR
dc.contributor.authorMILTAO, MILTON S.R.pt_BR
dc.contributor.authorMARTINEZ, LUIS G.pt_BR
dc.contributor.authorALVES, ALVARO S.pt_BR
dc.contributor.authorPASSOS, CARLOS A.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2014-07-31T11:35:26Zpt_BR
dc.date.accessioned2014-07-31T11:51:40Z
dc.date.available2014-07-31T11:35:26Zpt_BR
dc.date.available2014-07-31T11:51:40Z
dc.date.issued2010pt_BR
dc.description.abstractIn this work we aim to develop expressions for the calculation of biaxial and triaxial stresses in polycrystalline anisotropic materials, and to determine their elastic constants using the theory of elasticity for continuum isochoric deformations; thus, we also derive a model to determine residual stress. The constitutive relation between strain and stress in these models must be assumed to be orthotropic, obeying the generalized Hooke’s law. One technique that can be applied with our models is that of X-ray diffraction, because the experimental conditions are similar to the assumptions in the models, that is, it measures small deformations compared with the sample sizes and the magnitude of the tensions involved, and is insufficient to change the volume (isochoric deformation). Therefore, from the equations obtained, it is possible to use the sin2 technique for materials with texture or anisotropy by first characterizing the texture through the pole figures to determine possible angles that can be used in the equation, and then determining the deformation for each diffraction peak with the angles obtained from the pole figures.
dc.format.extent056601-1 - 056601-9pt_BR
dc.identifier.citationSANTOS, EDSON M.; ORLANDO, MARCOS T.D.; MILTAO, MILTON S.R.; MARTINEZ, LUIS G.; ALVES, ALVARO S.; PASSOS, CARLOS A. Model for analysis of biaxial and triaxial stresses by X-ray diffraction assuming orthotropic materials. <b>Japanese Journal of Applied Physics</b>, v. 49, n. 5, p. 056601-1 - 056601-9, 2010. DOI: <a href="https://dx.doi.org/10.1143/JJAP.49.056601">10.1143/JJAP.49.056601</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/8125.
dc.identifier.doi10.1143/JJAP.49.056601
dc.identifier.fasciculo5pt_BR
dc.identifier.issn0021-4922pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7707-7821
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/8125pt_BR
dc.identifier.vol49pt_BR
dc.relation.ispartofJapanese Journal of Applied Physicspt_BR
dc.rightsclosedAccessen
dc.subjectanisotropypt_BR
dc.subjectcalculation methodspt_BR
dc.subjectdeformationpt_BR
dc.subjecthooke lawpt_BR
dc.subjectmathematical modelspt_BR
dc.subjectpoisson ratiopt_BR
dc.subjectpolycrystalspt_BR
dc.subjectresidual stressespt_BR
dc.subjectshear propertiespt_BR
dc.subjectstrainspt_BR
dc.subjectstress analysispt_BR
dc.subjectx-ray diffractionpt_BR
dc.subjectyoung moduluspt_BR
dc.titleModel for analysis of biaxial and triaxial stresses by X-ray diffraction assuming orthotropic materialspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorLUIS GALLEGO MARTINEZ
ipen.codigoautor397
ipen.contributor.ipenauthorLUIS GALLEGO MARTINEZ
ipen.date.recebimento10-08pt_BR
ipen.identifier.fi1.024pt_BR
ipen.identifier.ipendoc15571pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi0.001 - 1.499
ipen.type.genreArtigo
relation.isAuthorOfPublicationd024d136-878b-4d31-bb7e-c1cb06324cfb
relation.isAuthorOfPublication.latestForDiscoveryd024d136-878b-4d31-bb7e-c1cb06324cfb
sigepi.autor.atividadeMARTINEZ, LUIS G.:397:730:Npt_BR

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