Half-life of 52V
| dc.contributor.author | OLIVA, JEFFERSON W.M. | pt_BR |
| dc.contributor.author | ZAHN, GUILHERME S. | pt_BR |
| dc.contributor.author | GENEZINI, FREDERICO A. | pt_BR |
| dc.contributor.editor | VANIN, VITO R. | pt_BR |
| dc.coverage | Internacional | pt_BR |
| dc.creator.evento | BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd | pt_BR |
| dc.date.accessioned | 2014-11-17T18:39:19Z | pt_BR |
| dc.date.accessioned | 2014-11-18T19:01:05Z | pt_BR |
| dc.date.accessioned | 2015-04-02T05:29:59Z | |
| dc.date.available | 2014-11-17T18:39:19Z | pt_BR |
| dc.date.available | 2014-11-18T19:01:05Z | pt_BR |
| dc.date.available | 2015-04-02T05:29:59Z | |
| dc.date.evento | September 7-11, 2010 | pt_BR |
| dc.description.abstract | In this work, the half life of the β decay of 52V was measured by following the activity of 32 samples of 50 μg each after they were irradiated in the IEA-R1 reactor of IPEN-CNEN/SP. The results were then fitted using a non-paralizable dead time correction to the regular exponential decay and the individual half-life values obtained were then analyzed using different statistical methods (Weighted Average, Normalized Residuals and Rajeval Technique), resulting in a value of 3.733(4) min. The obtained result is somewhat smaller than tabulated one but the difference does not surpass two standard deviations. | |
| dc.format.extent | 137-139 | pt_BR |
| dc.identifier.citation | OLIVA, JEFFERSON W.M.; ZAHN, GUILHERME S.; GENEZINI, FREDERICO A. Half-life of 52V. In: VANIN, VITO R. (ed.). In: BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd, September 7-11, 2010, Campos do Jordão, SP. <b>Proceedings...</b> p. 137-139. DOI: <a href="https://dx.doi.org/10.1063/1.3608947">10.1063/1.3608947</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/17877. | |
| dc.identifier.doi | 10.1063/1.3608947 | |
| dc.identifier.orcid | https://orcid.org/0000-0002-6318-6805 | |
| dc.identifier.orcid | https://orcid.org/0000-0003-3237-8588 | |
| dc.identifier.uri | http://repositorio.ipen.br/handle/123456789/17877 | pt_BR |
| dc.local.evento | Campos do Jordão, SP | pt_BR |
| dc.publisher | American Institute of Physics | pt_BR |
| dc.rights | openAccess | pt_BR |
| dc.subject | activation analysis | pt_BR |
| dc.subject | beta decay | pt_BR |
| dc.subject | beta decay radioisotopes | pt_BR |
| dc.subject | beta particles | pt_BR |
| dc.subject | days living radioisotopes | pt_BR |
| dc.subject | decay | pt_BR |
| dc.subject | half-life | pt_BR |
| dc.subject | lifetime | pt_BR |
| dc.subject | qualitative chemical analysis | pt_BR |
| dc.subject | quantitative chemical analysis | pt_BR |
| dc.subject | radioactivation | pt_BR |
| dc.subject | vanadium | pt_BR |
| dc.subject | vanadium 52 | pt_BR |
| dc.title | Half-life of 52V | pt_BR |
| dc.type | Texto completo de evento | pt_BR |
| dspace.entity.type | Publication | |
| ipen.autor | FREDERICO ANTONIO GENEZINI | |
| ipen.autor | GUILHERME SOARES ZAHN | |
| ipen.autor | JEFFERSON WILLIAN MOURE OLIVA | |
| ipen.codigoautor | 2045 | |
| ipen.codigoautor | 950 | |
| ipen.codigoautor | 8672 | |
| ipen.contributor.ipenauthor | FREDERICO ANTONIO GENEZINI | |
| ipen.contributor.ipenauthor | GUILHERME SOARES ZAHN | |
| ipen.contributor.ipenauthor | JEFFERSON WILLIAN MOURE OLIVA | |
| ipen.date.recebimento | 13-04 | pt_BR |
| ipen.event.datapadronizada | 2010 | pt_BR |
| ipen.identifier.ipendoc | 18871 | pt_BR |
| ipen.notas.internas | Proceedings | pt_BR |
| ipen.type.genre | Artigo | |
| relation.isAuthorOfPublication | 0c41d307-45a9-47c4-8281-5aa9ed46e6a4 | |
| relation.isAuthorOfPublication | de99ffee-d830-4bea-aeeb-e8f3ccc34921 | |
| relation.isAuthorOfPublication | 0e280bef-9cfa-4217-ada6-83e75967d4b2 | |
| relation.isAuthorOfPublication.latestForDiscovery | 0e280bef-9cfa-4217-ada6-83e75967d4b2 | |
| sigepi.autor.atividade | OLIVA, JEFFERSON W.M.:8672:310:S | pt_BR |
| sigepi.autor.atividade | ZAHN, GUILHERME S.:950:310:N | pt_BR |
| sigepi.autor.atividade | GENEZINI, FREDERICO A.:2045:310:N | pt_BR |
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