Half-life of 52V
Carregando...
Data
Data de publicação
2010
Autores IPEN
Orientador
Título da Revista
ISSN da Revista
Título do Volume
É parte de
É parte de
É parte de
É parte de
BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd
Exportar
Resumo
In this work, the half life of the β decay of 52V was measured by following the activity
of 32 samples of 50 μg each after they were irradiated in the IEA-R1 reactor of IPEN-CNEN/SP.
The results were then fitted using a non-paralizable dead time correction to the regular exponential
decay and the individual half-life values obtained were then analyzed using different statistical
methods (Weighted Average, Normalized Residuals and Rajeval Technique), resulting in a value of
3.733(4) min. The obtained result is somewhat smaller than tabulated one but the difference does
not surpass two standard deviations.
Como referenciar
OLIVA, JEFFERSON W.M.; ZAHN, GUILHERME S.; GENEZINI, FREDERICO A. Half-life of 52V. In: VANIN, VITO R. (ed.). In: BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd, September 7-11, 2010, Campos do Jordão, SP. Proceedings... p. 137-139. DOI: 10.1063/1.3608947. Disponível em: http://repositorio.ipen.br/handle/123456789/17877. Acesso em: 03 Nov 2026.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.