Characterization of nanostructured HfO2 films using perturbed angular correlation (PAC) technique

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dc.contributor.authorCAVALCANTE, F.H.M.pt_BR
dc.contributor.authorGOMES, M.R.pt_BR
dc.contributor.authorCARBONARI, A.W.pt_BR
dc.contributor.authorPEREIRA, L.F.D.pt_BR
dc.contributor.authorROSSETTO, D.A.pt_BR
dc.contributor.authorCOSTA, M.S.pt_BR
dc.contributor.authorREDONDO, L.M.pt_BR
dc.contributor.authorMESTNIK FILHO, J.pt_BR
dc.contributor.authorSAXENA, R.N.pt_BR
dc.contributor.authorSOARES, J.C.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2014-07-15T13:38:24Zpt_BR
dc.date.accessioned2014-07-30T11:47:07Z
dc.date.available2014-07-15T13:38:24Zpt_BR
dc.date.available2014-07-30T11:47:07Z
dc.date.issued2010pt_BR
dc.description.abstractThe hyperfine field at 181Ta lattice sites in nanostructured HfO2 thin films was studied by the Perturbed Angular Correlation (PAC) technique. Thin oxide films were deposited by Electron Beam Evaporation on a silicon substrate. The thickness of the films was ∼100 nm and ∼250 nm. Radioactive 181Hf nuclei were produced by neutron activation of the film samples in the Brazilian Research Reactor (IPEN IEA-R1) by the reaction 180Hf(n,γ )181Hf. PAC measurements were carried out after annealing at 1473 K. The PAC technique allows the determination of the electric field gradient (EFG) at the probe sites.
dc.format.extent41-45pt_BR
dc.identifier.citationCAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; REDONDO, L.M.; MESTNIK FILHO, J.; SAXENA, R.N.; SOARES, J.C. Characterization of nanostructured HfO2 films using perturbed angular correlation (PAC) technique. <b>Hyperfine Interactions</b>, v. 198, p. 41-45, 2010. DOI: <a href="https://dx.doi.org/10.1007/s10751-010-0250-z">10.1007/s10751-010-0250-z</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/4563.
dc.identifier.doi10.1007/s10751-010-0250-z
dc.identifier.issn0304-3843pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-4499-5949
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/4563pt_BR
dc.identifier.vol198pt_BR
dc.relation.ispartofHyperfine Interactionspt_BR
dc.rightsopenAccessen
dc.subjecthafnium oxidespt_BR
dc.subjectperturbed angular correlationpt_BR
dc.subjectspectroscopypt_BR
dc.subjectelectric fieldspt_BR
dc.subjectthin filmspt_BR
dc.titleCharacterization of nanostructured HfO2 films using perturbed angular correlation (PAC) techniquept_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorDANIEL DE ABREU ROSSETTO
ipen.autorMESSIAS DE SOUZA COSTA
ipen.autorRAJENDRA NARAIN SAXENA
ipen.autorJOSE MESTNIK FILHO
ipen.autorLUCIANO FABRICIO DIAS PEREIRA
ipen.autorARTUR WILSON CARBONARI
ipen.codigoautor7577
ipen.codigoautor9026
ipen.codigoautor1329
ipen.codigoautor1284
ipen.codigoautor3346
ipen.codigoautor1437
ipen.contributor.ipenauthorDANIEL DE ABREU ROSSETTO
ipen.contributor.ipenauthorMESSIAS DE SOUZA COSTA
ipen.contributor.ipenauthorRAJENDRA NARAIN SAXENA
ipen.contributor.ipenauthorJOSE MESTNIK FILHO
ipen.contributor.ipenauthorLUCIANO FABRICIO DIAS PEREIRA
ipen.contributor.ipenauthorARTUR WILSON CARBONARI
ipen.date.recebimento11-06pt_BR
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc16507pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication05cd5f61-a75a-4fcd-b593-28aaac4a9316
relation.isAuthorOfPublicationb4687c43-8df2-48ce-9bf1-8f4a677014c1
relation.isAuthorOfPublicatione8e73f41-f42e-41aa-97a1-c86c5706abe4
relation.isAuthorOfPublication2b2ff4a6-469a-462f-b6dd-1f692f94ebc8
relation.isAuthorOfPublicationb6252b5c-6acb-4cd0-bd90-b69988090f74
relation.isAuthorOfPublication8f236231-e73c-4182-a596-d83e49cd0404
relation.isAuthorOfPublication.latestForDiscovery8f236231-e73c-4182-a596-d83e49cd0404
sigepi.autor.atividadeCARBONARI, A.W.:1437:310:Npt_BR
sigepi.autor.atividadePEREIRA, L.F.D.:3346:310:Npt_BR
sigepi.autor.atividadeROSSETTO, D.A.:7577:310:Npt_BR
sigepi.autor.atividadeCOSTA, M.S.:9026:310:Npt_BR
sigepi.autor.atividadeMESTNIK FILHO, J.:1284:310:Npt_BR
sigepi.autor.atividadeSAXENA, R.N.:1329:310:Npt_BR
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