Ion implantation in titanium dioxide thin films studied by perturbed angular correlations

dc.contributor.authorSCHELL, JULIANA
dc.contributor.authorLUPASCU, DORU C.
dc.contributor.authorCARBONARI, ARTUR W.
dc.contributor.authorMANSANO, RONALDO D.
dc.contributor.authorRIBEIRO JUNIOR, IBERE S.
dc.contributor.authorDANG, THIEN T.
dc.contributor.authorANUSCA, IRINA
dc.contributor.authorTRIVEDI, HARSH
dc.contributor.authorJOHNSTON, KARL
dc.contributor.authorVIANDEN, REINER
dc.coverageInternacionalpt_BR
dc.date.accessioned2017-09-28T12:09:42Z
dc.date.available2017-09-28T12:09:42Z
dc.date.issued2017pt_BR
dc.description.abstractThe local environment in titanium dioxide was studied by the time dependent perturbed gamma-gamma angular correlation of In-111/Cd-111 and Hf-181/Ta-181 at the Helmholtz-Institut fur Strahlen-und Kernphysik, Bonn. An introduction to the implantation methodologies performed at the Bonn Radioisotope Separator is presented. The investigation was carried out on thin films, which were deposited by magnetic sputtering on Si. The results show two different sites for both probe nuclei with unique electric quadrupole interaction. Using Cd-111 one of them has been attributed to the substitutional Ti at the rutile structure. For Ta-181, the spectra show the anatase phase, with a well-defined electric quadrupole frequency.pt_BR
dc.format.extent145302-1 - 145302-7pt_BR
dc.identifier.citationSCHELL, JULIANA; LUPASCU, DORU C.; CARBONARI, ARTUR W.; MANSANO, RONALDO D.; RIBEIRO JUNIOR, IBERE S.; DANG, THIEN T.; ANUSCA, IRINA; TRIVEDI, HARSH; JOHNSTON, KARL; VIANDEN, REINER. Ion implantation in titanium dioxide thin films studied by perturbed angular correlations. <b>Journal of Applied Physics</b>, v. 121, n. 14, p. 145302-1 - 145302-7, 2017. DOI: <a href="https://dx.doi.org/10.1063/1.4980168">10.1063/1.4980168</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/27810.
dc.identifier.doi10.1063/1.4980168pt_BR
dc.identifier.fasciculo14pt_BR
dc.identifier.issn0021-8979pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-4499-5949
dc.identifier.percentilfi60.62en
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/27810
dc.identifier.vol121pt_BR
dc.relation.ispartofJournal of Applied Physicspt_BR
dc.rightsopenAccesspt_BR
dc.subjecttitanium
dc.subjection implantation
dc.subjectperturbed angular correlation
dc.subjectdifferential pac
dc.subjectradioisotopes
dc.subjecthyperfine structure
dc.subjectisotope separators
dc.titleIon implantation in titanium dioxide thin films studied by perturbed angular correlationspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorIBERE SOUZA RIBEIRO JUNIOR
ipen.autorARTUR WILSON CARBONARI
ipen.codigoautor10189
ipen.codigoautor1437
ipen.contributor.ipenauthorIBERE SOUZA RIBEIRO JUNIOR
ipen.contributor.ipenauthorARTUR WILSON CARBONARI
ipen.date.recebimento17-09pt_BR
ipen.identifier.fi2.176pt_BR
ipen.identifier.ipendoc23113pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi1.500 - 2.999
ipen.range.percentilfi50.00 - 74.99
ipen.type.genreArtigo
relation.isAuthorOfPublicationa978a384-2cd4-4fe3-8a0e-454eca29efe1
relation.isAuthorOfPublication8f236231-e73c-4182-a596-d83e49cd0404
relation.isAuthorOfPublication.latestForDiscovery8f236231-e73c-4182-a596-d83e49cd0404
sigepi.autor.atividadeCARBONARI, ARTUR W.:1437:310:Npt_BR
sigepi.autor.atividadeRIBEIRO JUNIOR, IBERE S.:10189:310:Npt_BR

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