SAXS signature of the lamellar ordering of ionic domains of perfluorinated sulfonic-acid ionomers by electric and magnetic field-assisted casting
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2020
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Physical Chemistry Chemical Physics
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At present, small angle X-ray scattering (SAXS) studies of perfluorinated sulfonic-acid ionomers (PFSAs)
are unable to fully determine the true shape of their building blocks, as recent SAXS modelling predicts
disk- and rod-like nanoionic domains as being equally possible. This scenario requires evidence-based
findings to unravel the real shape of PFSA building blocks. Herein, a SAXS pattern signature for a lamellar
nanophase separation of the ionic domains of Nafion is presented, backed by mid and far infrared
spectroscopy (MIR and FIR) and wide angle X-ray scattering (WAXS) data of Nafion in different ionic
forms, a broad range of ionic phase contents (EW ~ 859–42 252 g eq-1) and temperatures. The study
indicates that the lamellar arrangement of the ionic domains is the most representative morphology
that accounts for the physical properties of this ionomer. The lamellar SAXS reflections of Nafion are
enhanced in electric and magnetic field-aligned membranes, as confirmed by atomic force microscopy
(AFM). Electric and magnetic field-assisted casting of Nafion allowed producing nanostructured and
anisotropic films with the lamellas stacked perpendicularly to the field vector, which is the direction of
interest for several applications. Such nanostructured Nafion membranes are bestowed with advanced
optical and proton transport properties, making them promising materials for solar and fuel cells.
Como referenciar
SILVA, JAQUELINE S. da; CARVALHO, SABRINA G.M.; SILVA, RODRIGO P. da; TAVARES, ANA C.; SCHADE, ULRICH; PUSKAR, LJILJANA; FONSECA, FABIO C.; MATOS, BRUNO R. SAXS signature of the lamellar ordering of ionic domains of perfluorinated sulfonic-acid ionomers by electric and magnetic field-assisted casting. Physical Chemistry Chemical Physics, v. 22, n. 24, p. 13764-13779, 2020. DOI: 10.1039/d0cp01864c. Disponível em: http://repositorio.ipen.br/handle/123456789/31419. Acesso em: 13 Feb 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.