X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch

dc.contributor.authorBARROSO, A.G.pt_BR
dc.contributor.authorGARCIA, R.H.L.pt_BR
dc.contributor.authorDEL MASTRO, N.L.pt_BR
dc.coverageNacionalpt_BR
dc.date.accessioned2019-08-09T11:57:24Z
dc.date.available2019-08-09T11:57:24Z
dc.date.issued2019pt_BR
dc.description.abstractAfter cereals, tubers and roots are the major source of starch for food and industrial uses. Arrowroot refers to any plant of the genus Marantha, but the term is most commonly used to describe the easily digested starch ob-tained from the rhizomes of Marantha arundinacae. The rhizomes of this herbaceous plant contain about 20% of starch. As few studies exist on arrowroot starch, the objective of this preliminary work was to study the X-ray diffraction (XRD) patterns of arrowroot starch when treated by γ-radiation with doses up to 15 kGy in a 60Co source. The XRD patterns of the arrowroot starch exhibited A-type crystalline arrangements with strong peaks at approximately 15º, 17º, 18º and 23º (2θ). A slight increase of diffractogram peaks intensity was noticed after the irradiation process. The cristallinity index was calculated using Bruker DIFFRAC.EVA version 4.2 software. Relative crystallinity seems to increase with irradiation at low doses that could be attributed to different radia-tion sensitivity among the amorphous and crystalline regions of the arrowroot starch molecule. Present results will contribute to elucidate the behavior under radiation treatment of this starchy component increasingly em-ployed by the food industry.pt_BR
dc.format.extent1-7pt_BR
dc.identifier.citationBARROSO, A.G.; GARCIA, R.H.L.; DEL MASTRO, N.L. X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch. <b>Brazilian Journal of Radiation Sciences</b>, v. 7, n. 2A, p. 1-7, 2019. DOI: <a href="https://dx.doi.org/10.15392/bjrs.v7i2A.645">10.15392/bjrs.v7i2A.645</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/30056.
dc.identifier.doi10.15392/bjrs.v7i2A.645pt_BR
dc.identifier.fasciculo2Apt_BR
dc.identifier.issn2319-0612pt_BR
dc.identifier.orcid0000-0001-7937-0079pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-3602-6857
dc.identifier.percentilfiSem Percentilpt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30056
dc.identifier.vol7pt_BR
dc.relation.ispartofBrazilian Journal of Radiation Sciencespt_BR
dc.rightsopenAccesspt_BR
dc.sourceThe Meeting on Nuclear Applications (ENAN), 13th, 22-27 de outubro, 2017, Belo Horizonte, MGpt_BR
dc.subjectx-ray diffraction
dc.subjectgamma radiation
dc.subjectstarch
dc.subjectradiation effects
dc.subjectradiation doses
dc.subjectcobalt 60
dc.subjectcrystal structure
dc.subjectirradiation
dc.titleX-ray diffraction pattern and relative crystallinity of irradiated arrowroot starchpt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorALINE G. BARROSO
ipen.autorNELIDA LUCIA DEL MASTRO
ipen.autorRAFAEL HENRIQUE LAZZARI GARCIA
ipen.codigoautor15236
ipen.codigoautor1225
ipen.codigoautor3498
ipen.contributor.ipenauthorALINE G. BARROSO
ipen.contributor.ipenauthorNELIDA LUCIA DEL MASTRO
ipen.contributor.ipenauthorRAFAEL HENRIQUE LAZZARI GARCIA
ipen.date.recebimento19-08
ipen.identifier.fiSem F.I.pt_BR
ipen.identifier.ipendoc25849pt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublication3ea7f0d0-b70d-40a3-8424-f037aab4c44f
relation.isAuthorOfPublication3c153344-3df9-4d73-8840-769187b0b885
relation.isAuthorOfPublicationf5874229-caf7-49a4-97aa-bae7e7be18e8
relation.isAuthorOfPublication.latestForDiscovery3ea7f0d0-b70d-40a3-8424-f037aab4c44f
sigepi.autor.atividadeDEL MASTRO, N.L.:1225:210:Npt_BR
sigepi.autor.atividadeGARCIA, R.H.L.:3498:730:Npt_BR
sigepi.autor.atividadeBARROSO, A.G.:15236:-1:S

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