Application of scanning electrochemical microscopy (SECM) for local characterization of AA2098-T351 surface in different conditions
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2018
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CONGRESSO BRASILEIRO DE ENGENHARIA E CIÊNCIA DOS MATERIAIS, 23.
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Resumo
Aluminum alloys are commonly used in automotive and aerospace applications
because of their good mechanical properties and low density. The aluminum-lithium
(Al-Li) alloys are a class of Al-alloys which have some superior properties, such as
lower densities than conventional ones and, for this reason, used as structural
components in aircrafts. The addition of lithium aims to reduce density of the material
with gains in the mechanical properties and in the specific modules, which is important
for the aerostructures. However, the addition of this element usually increases
localized corrosion susceptibility. The scanning electrochemical microscopy (SECM)
technique can provide a good understanding about the corrosion behavior and the
local reactions of this class of materials. In this work, different modes of SECM
measurements were employed to characterize the AA2098-T351 surface in various
conditions. The surface generation/tip collection (SG/TC) mode and competition mode
were employed to study the hydrogen gas (H2) evolution and oxygen reduction,
respectively, in the AA2098-T351 surface in the conditions: polished and unpolished.
It was found that the main domains of H2 evolution and oxygen reduction are
associated with the alloy surface in the polished condition.The feedback mode of
SECM was employed to characterize the electrochemical activity of the surface after
immersion in a solution containing ions chloride, in order to verify the influence of the
oxide layer formation over the surface in the active/passive domains due the corrosion
process. The previously attacked surface revealed a much lower electrochemical
activity compared with the surface in the polished condition due to the protective
character of the oxide formed during immersion test.
Como referenciar
SILVA, R.M.P.; MILAGRE, M.X.; COSTA, I.; OLIVEIRA, L.A. de. Application of scanning electrochemical microscopy (SECM) for local characterization of AA2098-T351 surface in different conditions. In: CONGRESSO BRASILEIRO DE ENGENHARIA E CIÊNCIA DOS MATERIAIS, 23., 04-08 de novembro, 2018, Foz do Iguaçu, PR. Resumo... p. 4948-4948. Disponível em: http://repositorio.ipen.br/handle/123456789/29562. Acesso em: 30 Dec 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.