Radiation damage study on the electrical properties of Si diodes

Página do item simplificado
dc.contributor.authorPASCOALINO, KELLY C.S.pt_BR
dc.contributor.authorGONCALVES, JOSEMARY A.C.pt_BR
dc.contributor.authorTOBIAS, CARMEN C.B.pt_BR
dc.contributor.editorVANIN, VITO R.pt_BR
dc.coverageInternacionalpt_BR
dc.creator.eventoBRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rdpt_BR
dc.date.accessioned2014-11-17T18:39:20Zpt_BR
dc.date.accessioned2014-11-18T19:01:40Zpt_BR
dc.date.accessioned2015-04-02T05:09:20Z
dc.date.available2014-11-17T18:39:20Zpt_BR
dc.date.available2014-11-18T19:01:40Zpt_BR
dc.date.available2015-04-02T05:09:20Z
dc.date.eventoSeptember 7-11, 2010pt_BR
dc.format.extent345-348pt_BR
dc.identifier.citationPASCOALINO, KELLY C.S.; GONCALVES, JOSEMARY A.C.; TOBIAS, CARMEN C.B. Radiation damage study on the electrical properties of Si diodes. In: VANIN, VITO R. (ed.). In: BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd, September 7-11, 2010, Campos do Jordão, SP. <b>Proceedings...</b> p. 345-348. Disponível em: http://repositorio.ipen.br/handle/123456789/17879.
dc.identifier.orcidhttps://orcid.org/0000-0001-7881-7254
dc.identifier.orcidhttps://orcid.org/0000-0002-8940-9544
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/17879pt_BR
dc.local.eventoCampos do Jordão, SPpt_BR
dc.publisherAmerican Institute of Physicspt_BR
dc.rightsopenAccesspt_BR
dc.subjectcapacitancept_BR
dc.subjectcobalt 60pt_BR
dc.subjectdose ratespt_BR
dc.subjectdosespt_BR
dc.subjectelectric currentspt_BR
dc.subjectelectric potentialpt_BR
dc.subjectirradiationpt_BR
dc.subjectphysical radiation effectspt_BR
dc.subjectsiliconpt_BR
dc.subjectsilicon diodespt_BR
dc.titleRadiation damage study on the electrical properties of Si diodespt_BR
dc.typeTexto completo de eventopt_BR
dspace.entity.typePublication
ipen.autorCARMEN CECILIA BUENO TOBIAS
ipen.autorJOSEMARY ANGELICA CORREA GONCALVES
ipen.autorKELLY CRISTINA DA SILVA PASCOALINO
ipen.codigoautor1592
ipen.codigoautor924
ipen.codigoautor6608
ipen.contributor.ipenauthorCARMEN CECILIA BUENO TOBIAS
ipen.contributor.ipenauthorJOSEMARY ANGELICA CORREA GONCALVES
ipen.contributor.ipenauthorKELLY CRISTINA DA SILVA PASCOALINO
ipen.date.recebimento13-04pt_BR
ipen.event.datapadronizada2010pt_BR
ipen.identifier.ipendoc18890pt_BR
ipen.notas.internasProceedingspt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationfa74399b-83a0-4f46-91e0-da469104d3f6
relation.isAuthorOfPublication76fdc4d1-7624-4332-a9d0-f06826000679
relation.isAuthorOfPublication3635b910-bf6b-403f-9a41-6b16dcd43d8a
relation.isAuthorOfPublication.latestForDiscovery3635b910-bf6b-403f-9a41-6b16dcd43d8a
sigepi.autor.atividadePASCOALINO, KELLY C.S.:6608:240:Spt_BR
sigepi.autor.atividadeGONÇALVES, JOSEMARY A.C.:924:240:Npt_BR
sigepi.autor.atividadeTOBIAS, CARMEN C.B.:1592:240:Npt_BR
Pacote Original
Agora exibindo 1 - 1 de 1
Imagem de Miniatura
Nome:
18890.pdf
Tamanho:
294.95 KB
Formato:
Adobe Portable Document Format
Baixar
Coleções
Eventos