Mathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate

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dc.contributor.authorBENITEZ, FERNANDO G.J.
dc.contributor.authorPERUZZI, ALEJANDRO J.B.
dc.contributor.authorFARIA JUNIOR, RUBENS N.
dc.coverageInternacional
dc.date.accessioned2024-06-14T18:11:55Z
dc.date.available2024-06-14T18:11:55Z
dc.date.issued2024
dc.description.abstractA straightforward RC series circuit model was proposed to fit the cyclic voltammetry experimental data of various symmetrical electrochemical supercapacitors. The model simulated the experimental behavior for exponential dependence of capacitance on the scan rate. In this model, the zero-scan rate capacitance was considered as a constant, and the equivalent serial resistance depended on the scan rate. Neither the equivalent parallel resistance nor a possible intrinsic dependence of capacitance on applied voltage was considered in the modelling.
dc.description.sponsorshipMinistry of Economy and Finance of the Government of the Republic of Paraguay
dc.description.sponsorshipIDMinistry of Economy and Finance of the Government of the Republic of Paraguay: 171/2019
dc.format.extent1-9
dc.identifier.citationBENITEZ, FERNANDO G.J.; PERUZZI, ALEJANDRO J.B.; FARIA JUNIOR, RUBENS N. Mathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate. <b>Journal of Energy Storage</b>, v. 87, p. 1-9, 2024. DOI: <a href="https://dx.doi.org/10.1016/j.est.2024.111267">10.1016/j.est.2024.111267</a>. Disponível em: https://repositorio.ipen.br/handle/123456789/48109.
dc.identifier.doi10.1016/j.est.2024.111267
dc.identifier.issn2352-152X
dc.identifier.percentilfi83.3
dc.identifier.percentilfiCiteScore87.67
dc.identifier.urihttps://repositorio.ipen.br/handle/123456789/48109
dc.identifier.vol87
dc.relation.ispartofJournal of Energy Storage
dc.rightsopenAccess
dc.subjectcapacitors
dc.subjectenergy storage
dc.subjectcapacitive energy storage equipment
dc.subjectcapacitance
dc.subjectvoltametry
dc.subjectsimulation
dc.titleMathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate
dc.typeArtigo de periódico
dspace.entity.typePublication
ipen.autorFERNANDO GABRIEL BENITEZ JARA
ipen.autorRUBENS NUNES DE FARIA JUNIOR
ipen.codigoautor14421
ipen.codigoautor227
ipen.contributor.ipenauthorFERNANDO GABRIEL BENITEZ JARA
ipen.contributor.ipenauthorRUBENS NUNES DE FARIA JUNIOR
ipen.identifier.fi8.9
ipen.identifier.fiCiteScore11.8
ipen.identifier.ipendoc30417
ipen.identifier.iwosWoS
ipen.range.fi6.000 ou mais
ipen.range.percentilfi75.00 - 100.00
ipen.type.genreArtigo
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relation.isAuthorOfPublication20cb7788-3957-4550-9e5c-cf7f5261eec4
relation.isAuthorOfPublication.latestForDiscoveryfff28811-7286-46a8-9eb3-bdf9674f83ff
sigepi.autor.atividadeFERNANDO GABRIEL BENITEZ JARA:14421:730:S
sigepi.autor.atividadeRUBENS NUNES DE FARIA JUNIOR:227:730:N
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