Calibration coefficients of epitaxial diodes used in diagnostic radiology and computed tomography beams
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Brazilian Journal of Radiation Sciences
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Resumo
The assessment of the calibration coefficients of an epitaxial diode, previously
characterized for diagnostic radiology (RQR qualities) and computed tomography (RQT
qualities) dosimetry, is reported in this work. The diode, with an n-type epitaxial layer (50
µm) grown on a thick (300 µm) Czochralski silicon substrate, is directly connected to an
electrometer Keithley 6517B in the photovoltaic mode and exposed to X-ray beams from
a Pantak/Seifert generator, model Isovolt 160 HS. Under this operational condition, the
dosimetric quantity is the dose rate correlated with the output current signal from the
diode when exposed to radiation. The corresponding collected charge (the integral of the
current signal) is proportional to the dose. The repeatability of the current signals and the
dose response of the diode are investigated in several RQR and RQT beam qualities
spanning from 50 kV to 150 kV. The calibration coefficients (Nk) are assessed by linking
the diode readings to those from the standard ionization chambers for reference beam
qualities (RQR-5 and RQT-9) following the formalism recommended by Technical
Reports Series No. 457. To take into account the variations of the X-ray beams related to
the correspondent reference beam qualities, the correction factors are also calculated.
Despite being close to 1, they evidence the energy dependence of the EPI diode for
voltages above 100 kV.
Como referenciar
GONCALVES, J.A.C.; ANTONIO, P.L.; CALDAS, L.V.E.; BUENO, C.C. Calibration coefficients of epitaxial diodes used in diagnostic radiology and computed tomography beams. Brazilian Journal of Radiation Sciences, v. 12, n. 4A, p. 1-10, 2024. DOI: 10.15392/2319-0612.2024.2576. Disponível em: https://repositorio.ipen.br/handle/123456789/49051. Acesso em: 20 Mar 2026.
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