Effect of nitrogen-doping on the surface chemistry and corrosion stability of TiO2 films

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dc.contributor.authorSOUZA FILHO, EDVAN A. dept_BR
dc.contributor.authorPIERETTI, EURICO F.pt_BR
dc.contributor.authorBENTO, RODRIGO T.pt_BR
dc.contributor.authorPILLIS, MARINA F.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2020-02-27T19:36:11Z
dc.date.available2020-02-27T19:36:11Z
dc.date.issued2020pt_BR
dc.description.abstractTiO2 and N-doped TiO2 films were grown on AISI 316 stainless steel substrates and on Si (100) by metallorganic chemical vapor deposition (MOCVD) at 400 ◦C and 500 ◦C. X-ray photoelectron spectroscopy, scanning electron microscopy, and contact angle techniques were used to characterize de films. The corrosion behavior was assessed by monitoring the open circuit potential, electrochemical impedance spectroscopy and potentiodynamic polarization tests in 3.5 wt% NaCl solution at room temperature. The results show that 6.18 at% of nitrogen was introduced in the films grown at 400 ◦C and 8.23 at% at 500 ◦C, and that besides TiO2, nitrogen phases were identified. All the films are hydrophilic and the contact angles varied from 48◦ to 72◦. The films presented good homogeneity, low porosity and rounded grains in the range of 40–90 nm. The RMS roughness varied between 5.5 and 18.5 nm. Titanium dioxide films grown at 400 ◦C showed better corrosion resistance than those grown at 500 ◦C due to its compact morphology. Nitrogen-doping was not efficient to protect the substrate from corrosion.pt_BR
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)pt_BR
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)pt_BR
dc.description.sponsorshipIDCNPq: 168935/2018-0pt_BR
dc.description.sponsorshipIDFAPESP: 05/55861-4pt_BR
dc.format.extent922-934pt_BR
dc.identifier.citationSOUZA FILHO, EDVAN A. de; PIERETTI, EURICO F.; BENTO, RODRIGO T.; PILLIS, MARINA F. Effect of nitrogen-doping on the surface chemistry and corrosion stability of TiO2 films. <b>Journal of Materials Research and Technology</b>, v. 9, n. 1, p. 922-934, 2020. DOI: <a href="https://dx.doi.org/10.1016/j.jmrt.2019.11.032">10.1016/j.jmrt.2019.11.032</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/30830.
dc.identifier.doi10.1016/j.jmrt.2019.11.032pt_BR
dc.identifier.fasciculo1pt_BR
dc.identifier.issn2238-7854pt_BR
dc.identifier.orcid0000-0002-1423-871Xpt_BR
dc.identifier.orcid0000-0002-1797-9652pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-1423-871X
dc.identifier.percentilfi79.15pt_BR
dc.identifier.percentilfiCiteScore60.00
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/30830
dc.identifier.vol9pt_BR
dc.relation.ispartofJournal of Materials Research and Technologypt_BR
dc.rightsopenAccesspt_BR
dc.subjectdoped materials
dc.subjectfilms
dc.subjectnitrogen
dc.subjectchemical vapor deposition
dc.subjectcorrosion resistance
dc.subjecttitanium oxides
dc.subjectscanning electron microscopy
dc.subjectphotoelectron spectroscopy
dc.subjectelectrochemistry
dc.subjectimpedance
dc.titleEffect of nitrogen-doping on the surface chemistry and corrosion stability of TiO2 filmspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorEURICO FELIX PIERETTI
ipen.autorRODRIGO TEIXEIRA BENTO
ipen.autorMARINA FUSER PILLIS
ipen.autorEDVAN ALMEIDA DE SOUZA FILHO
ipen.codigoautor9762
ipen.codigoautor14417
ipen.codigoautor758
ipen.codigoautor11586
ipen.contributor.ipenauthorEURICO FELIX PIERETTI
ipen.contributor.ipenauthorRODRIGO TEIXEIRA BENTO
ipen.contributor.ipenauthorMARINA FUSER PILLIS
ipen.contributor.ipenauthorEDVAN ALMEIDA DE SOUZA FILHO
ipen.date.recebimento20-02
ipen.identifier.fi5.039pt_BR
ipen.identifier.fiCiteScore3.5
ipen.identifier.ipendoc26655pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.range.fi4.500 - 5.999
ipen.range.percentilfi75.00 - 100.00
ipen.type.genreArtigo
relation.isAuthorOfPublication81bdc39e-9843-47fe-bbed-2ab1670d694a
relation.isAuthorOfPublication1399531c-e590-4f6e-9199-69603dcc1642
relation.isAuthorOfPublication90a23f45-0a62-4233-b676-a06bd75d6cc3
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relation.isAuthorOfPublication.latestForDiscovery6be68cd5-9b08-4c82-bc35-302a92f5f599
sigepi.autor.atividadePILLIS, MARINA F.:758:730:Npt_BR
sigepi.autor.atividadeBENTO, RODRIGO T.:14417:730:Npt_BR
sigepi.autor.atividadePIERETTI, EURICO F.:9762:-1:Npt_BR
sigepi.autor.atividadeSOUZA FILHO, EDVAN A. de:11586:-1:Spt_BR
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