Measurement of the exposure rate due to low energy X-ray emitted from video display terminals

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dc.contributor.authorCAMPOS, L.L.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2014-07-30T17:23:29Zpt_BR
dc.date.accessioned2014-07-30T19:01:15Z
dc.date.available2014-07-30T17:23:29Zpt_BR
dc.date.available2014-07-30T19:01:15Z
dc.date.issued1988pt_BR
dc.format.extent173-174pt_BR
dc.identifier.citationCAMPOS, L.L. Measurement of the exposure rate due to low energy X-ray emitted from video display terminals. <b>International Journal Radiation Applied Instrumentation</b>, v. 39, n. 2, p. 173-174, 1988. Part A. Appl. Radiat. Isot. Disponível em: http://repositorio.ipen.br/handle/123456789/6644.
dc.identifier.fasciculo2pt_BR
dc.identifier.issn0883-2889pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7137-0613
dc.identifier.suplementoPart A. Appl. Radiat. Isotpt_BR
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/6644pt_BR
dc.identifier.vol39pt_BR
dc.relation.ispartofInternational Journal Radiation Applied Instrumentationpt_BR
dc.rightsopenAccessen
dc.subjectx radiationpt_BR
dc.subjectexposure ratemeterspt_BR
dc.titleMeasurement of the exposure rate due to low energy X-ray emitted from video display terminalspt_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorLETICIA LUCENTE CAMPOS RODRIGUES
ipen.codigoautor1195
ipen.contributor.ipenauthorLETICIA LUCENTE CAMPOS RODRIGUES
ipen.date.recebimento88-12pt_BR
ipen.identifier.ipendoc01632pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationd4d34119-a6e6-4026-9a67-7b16d8b668da
relation.isAuthorOfPublication.latestForDiscoveryd4d34119-a6e6-4026-9a67-7b16d8b668da
sigepi.autor.atividadeCAMPOS, L.L.:1195:-1:Spt_BR

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