Error analysis for near-field EMC problems based on multipolar expansion approach
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2016
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BIENNIAL CONFERENCE ON ELECTROMAGNETIC FIELD COMPUTATION, 17th
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Resumo
The characterization of near-field couplings becomes
an extremely important activity to optimize the best nominal
performance of any electronic device in the presence of others.
In order to handle the electromagnetic compatibility (EMC)
problems at the initial design phase, a predictive method based on
multipolar expansion in spherical harmonics has been developed.
A new automatic measurement system has also been designed
which allows the measurements of the magnetic field all around
the device. In this paper, the impacts of the measurement
uncertainties and the disturbances caused by the power wires
are studied.
Como referenciar
LI, Z.; TAVERNIER, F.; KRAHENBUHL, L.; VOYER, D.; SARTORI, C.; BREARD, A. Error analysis for near-field EMC problems based on multipolar expansion approach. In: BIENNIAL CONFERENCE ON ELECTROMAGNETIC FIELD COMPUTATION, 17th, November 13-16, 2016, Miami, Florida, USA. Abstract... p. 1-1. Disponível em: http://repositorio.ipen.br/handle/123456789/27539. Acesso em: 30 Dec 2025.
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