Error analysis for near-field EMC problems based on multipolar expansion approach

dc.contributor.authorLI, Z.
dc.contributor.authorTAVERNIER, F.
dc.contributor.authorKRAHENBUHL, L.
dc.contributor.authorVOYER, D.
dc.contributor.authorSARTORI, C.
dc.contributor.authorBREARD, A.
dc.coverageInternacionalpt_BR
dc.creator.eventoBIENNIAL CONFERENCE ON ELECTROMAGNETIC FIELD COMPUTATION, 17thpt_BR
dc.date.accessioned2017-05-30T17:23:39Z
dc.date.available2017-05-30T17:23:39Z
dc.date.eventoNovember 13-16, 2016pt_BR
dc.description.abstractThe characterization of near-field couplings becomes an extremely important activity to optimize the best nominal performance of any electronic device in the presence of others. In order to handle the electromagnetic compatibility (EMC) problems at the initial design phase, a predictive method based on multipolar expansion in spherical harmonics has been developed. A new automatic measurement system has also been designed which allows the measurements of the magnetic field all around the device. In this paper, the impacts of the measurement uncertainties and the disturbances caused by the power wires are studied.pt_BR
dc.event.siglaIEEE CEFCpt_BR
dc.format.extent1-1pt_BR
dc.identifier.citationLI, Z.; TAVERNIER, F.; KRAHENBUHL, L.; VOYER, D.; SARTORI, C.; BREARD, A. Error analysis for near-field EMC problems based on multipolar expansion approach. In: BIENNIAL CONFERENCE ON ELECTROMAGNETIC FIELD COMPUTATION, 17th, November 13-16, 2016, Miami, Florida, USA. <b>Abstract...</b> p. 1-1. Disponível em: http://repositorio.ipen.br/handle/123456789/27539.
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/27539
dc.local.eventoMiami, Florida, USApt_BR
dc.rightsopenAccesspt_BR
dc.titleError analysis for near-field EMC problems based on multipolar expansion approachpt_BR
dc.typeResumo de eventos científicospt_BR
dspace.entity.typePublication
ipen.autorCARLOS ANTONIO FRANCA SARTORI
ipen.codigoautor257
ipen.contributor.ipenauthorCARLOS ANTONIO FRANCA SARTORI
ipen.date.recebimento17-05pt_BR
ipen.event.datapadronizada2016pt_BR
ipen.identifier.ipendoc22689pt_BR
ipen.notas.internasAbstractpt_BR
ipen.type.genreResumo
relation.isAuthorOfPublication537d959e-c0a4-4163-8e8c-ac3badc87900
relation.isAuthorOfPublication.latestForDiscovery537d959e-c0a4-4163-8e8c-ac3badc87900
sigepi.autor.atividadeSARTORI, C.:257:-1:Npt_BR

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