Analytical description of z-scan on-axis intensity based on the Huygens-Fresnel principle

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dc.contributor.authorSAMAD, R.E.pt_BR
dc.contributor.authorVIEIRA JUNIOR, N.D.pt_BR
dc.coverageInternacionalpt_BR
dc.date.accessioned2014-07-30T17:23:08Zpt_BR
dc.date.accessioned2014-07-30T18:57:49Z
dc.date.available2014-07-30T17:23:08Zpt_BR
dc.date.available2014-07-30T18:57:49Z
dc.date.issued1998pt_BR
dc.format.extent2742-2747pt_BR
dc.identifier.citationSAMAD, R.E.; VIEIRA JUNIOR, N.D. Analytical description of z-scan on-axis intensity based on the Huygens-Fresnel principle. <b>Journal of the Optical Society of America, B</b>, v. 15, n. 11, p. 2742-2747, 1998. Disponível em: http://repositorio.ipen.br/handle/123456789/6342.
dc.identifier.fasciculo11pt_BR
dc.identifier.issn0740-3224pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0092-9357
dc.identifier.orcidhttps://orcid.org/0000-0001-7762-8961
dc.identifier.urihttp://repositorio.ipen.br/handle/123456789/6342pt_BR
dc.identifier.vol15pt_BR
dc.relation.ispartofJournal of the Optical Society of America, Bpt_BR
dc.rightsopenAccessen
dc.subjectnonlinear opticspt_BR
dc.subjectlaserspt_BR
dc.subjectelectric fieldspt_BR
dc.subjecthuygens principlept_BR
dc.subjectanalytical solutionpt_BR
dc.subjectgaussian processespt_BR
dc.subjectrefractive indexpt_BR
dc.titleAnalytical description of z-scan on-axis intensity based on the Huygens-Fresnel principlept_BR
dc.typeArtigo de periódicopt_BR
dspace.entity.typePublication
ipen.autorNILSON DIAS VIEIRA JUNIOR
ipen.autorRICARDO ELGUL SAMAD
ipen.codigoautor1582
ipen.codigoautor909
ipen.contributor.ipenauthorNILSON DIAS VIEIRA JUNIOR
ipen.contributor.ipenauthorRICARDO ELGUL SAMAD
ipen.date.recebimento03-08pt_BR
ipen.identifier.ipendoc09046pt_BR
ipen.identifier.iwosWoSpt_BR
ipen.type.genreArtigo
relation.isAuthorOfPublicationb5e4f489-bfb7-4e48-ae3a-eced2bb93a16
relation.isAuthorOfPublicationb9c43c0c-87a6-4ebd-92ff-2515c4ac1d34
relation.isAuthorOfPublication.latestForDiscoveryb9c43c0c-87a6-4ebd-92ff-2515c4ac1d34
sigepi.autor.atividadeSAMAD, R.E.:909:-1:Spt_BR
sigepi.autor.atividadeVIEIRA JUNIOR, N.D.:1582:-1:Npt_BR

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