Microbiologically influenced corrosion of Al–Cu–Li alloy by Pseudomonas aeruginosa
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Journal of Materials Research and Technology
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This study investigates microbiologically influenced corrosion (MIC) of the Al–Cu–Li alloy AA2060-T8 caused by
Pseudomonas aeruginosa. Key parameters—bacterial population (OD600), specific biofilm-forming capacity (SBF),
pH, and open circuit potential (OCP)—were monitored over time and correlated with bacterial growth stages. A
colonization time range between 3 and 10 h was identified (OD600: 0.23–0.67), during which P. aeruginosa
produced a critical biofilm amount (SBF: 0.14–0.74) sufficient to sustain irreversible adhesion on the alloy
surface, as indicated by the OCP increase from 4 h. Furthermore, a pH decrease from 7.6 to 6.8 was observed
during the exponential stage, likely reaching pH 3.5–4.5 within colony cores. This could have created conditions
that facilitated the destabilization of the oxide layer beneath the biofilm, making the alloy more susceptible to
localized corrosion. After 24 h of exposure to the MIC testing solution, cross-sectional analysis of the alloy
revealed discontinuities within the biofilm, which allowed the electrolyte to reach the alloy surface and promote
the formation of local differential cells. Thus, MIC of the AA2060-T8 alloy caused by P. aeruginosa is mainly due
to the combined effects of pH decrease and the formation of discontinuities acting as channels within the biofilm.
These findings provide new insights into the MIC of Al–Cu–Li alloys, paving the way for future protection
strategies against MIC.
Como referenciar
RAMIREZ, C.G.; MONSALVE, A.; MONTERO, C.; ESPINOZA, J.; ARAUJO, J.; VEJAR, N.; AZOCAR, M.; GULPPI, M.; JIMENEZ-AREVALO, V.M.; ZHOU, X.; PAEZ, M.A. Microbiologically influenced corrosion of Al–Cu–Li alloy by Pseudomonas aeruginosa. Journal of Materials Research and Technology, v. 36, p. 5286-5297, 2025. DOI: 10.1016/j.jmrt.2025.04.188. Disponível em: https://repositorio.ipen.br/handle/123456789/49374. Acesso em: 04 Mar 2026.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.