Mathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate
Carregando...
Data
2024
Data de publicação:
Orientador
Título da Revista
ISSN da Revista
Título do Volume
É parte de
É parte de
É parte de
Journal of Energy Storage
Exportar
Resumo
A straightforward RC series circuit model was proposed to fit the cyclic voltammetry experimental data of various symmetrical electrochemical supercapacitors. The model simulated the experimental behavior for exponential dependence of capacitance on the scan rate. In this model, the zero-scan rate capacitance was considered as a constant, and the equivalent serial resistance depended on the scan rate. Neither the equivalent parallel resistance nor a possible intrinsic dependence of capacitance on applied voltage was considered in the modelling.
Como referenciar
BENITEZ, FERNANDO G.J.; PERUZZI, ALEJANDRO J.B.; FARIA JUNIOR, RUBENS N. Mathematical expressions for simulation of supercapacitor voltammetry curves and capacitance dependence on scan rate. Journal of Energy Storage, v. 87, p. 1-9, 2024. DOI: 10.1016/j.est.2024.111267. Disponível em: https://repositorio.ipen.br/handle/123456789/48109. Acesso em: 16 Mar 2025.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.